Patent Assignment
Reel/Frame 019630/0439
Assignment of Assignor's Interest
Recorded: 2007-08-01
Pages: 2
Assignor
NAGAI, KOUICHI
Executed: 2007-04-27
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI,, KANAGAWA, 211-8588, JAPAN
Covered Property
(1)
Semiconductor Wafer and Method of Testing the Same
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 9, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0089 →
Change of Name
Sep 27, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 025046/0478 →
Assignment of Assignor's Interest
Apr 17, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035453/0904 →