Patent Assignment
Reel/Frame 035453/0904
Assignment of Assignor's Interest
Recorded: 2015-04-17
Pages: 6
Assignor
FUJITSU SEMICONDUCTOR LIMITED
Executed: 2015-03-02
Assignee
SOCIONEXT INC.
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU, YOKOHAMA-SHI, KANAGAWA, 222-0033, JAPAN
Covered Properties
(53)
Semiconductor Wafer and Method of Testing the Same
Processor and Information Processing System
Application:
12/795,478 →
Publication:
US 2010/0318766
Semiconductor Device and Method for Manufacturing the Same
Simulation Apparatus, Method, and Computer-Readable Recording Medium
Semiconductor Device
Application:
13/368,892 →
Publication:
US 2012/0223392
Semiconductor Device and Method of Producing Semiconductor Device
Application:
13/463,399 →
Publication:
US 2012/0220103
Semiconductor Device Having Antenna Element and Method of Manufacturing Same
Semiconductor Device and Manufacturing Method Therefor
Audio Signal Encoding Method and Device
Image Processor, Image Pickup Apparatus, Image Pickup System and Data Processing Method
Method and Apparatus for Peeling Electronic Component
Semiconductor Device and Method for Fabricating the Same
Application:
13/668,623 →
Publication:
US 2013/0134574
Picture Detection Device, Picture Recording Device, Picture Recording/Reproduction Device, Picture Detection Method, Picture Recording Method, and Picture Recording/Reproduction Method
Application:
13/669,678 →
Publication:
US 2013/0156308
Constant Voltage Circuit
Semiconductor Device with High Breakdown Voltage and Manufacture Thereof
Storage Body and Reel
Semiconductor Storage Device and Method of Manufacturing the Same
Method of Manufacturing Semiconductor Device Including Semiconductor Elements Connected to Each Other
Application:
13/775,279 →
Publication:
US 2013/0164889
Encapsulated Semiconductor Chips with Wiring Including Controlling Chip and Method of Making the Same
Manufacturing Method of Semiconductor Device
Semiconductor Device and Method for Manufacturing the Same
Semiconductor Device and Method of Manufacturing the Same
Semiconductor Device and Manufacturing Method of Semiconductor Device
Application:
13/971,314 →
Publication:
US 2014/0061887
Semiconductor Device, Electronic Device and Method for Fabricating the Semiconductor Device
Semiconductor Device and Method for Fabricating the Same
Application:
14/085,124 →
Publication:
US 2014/0077392
Method for Manufacturing a Semiconductor Device Having Multiple Heat Sinks
Semiconductor Device Having a High Frequency External Connection Electrode Positioned Within a via Hole
Semiconductor Device Manufacturing Method
Semiconductor Device and Manufacturing Method of the Same
Semiconductor Device Including Two Groove-Shaped Patterns
Semiconductor Device Including Two Groove-Shaped Patterns That Include Two Bent Portions
Ball Grid Array Semiconductor Device and Its Manufacture
Application:
14/184,352 →
Publication:
US 2014/0170814
Semiconductor Device
Bonding Apparatus and Bonding Method
Method for Manufacturing a Semiconductor Device Having Moisture-Resistant Rings Being Formed in a Peripheral Region.
Application:
14/286,253 →
Publication:
US 2014/0273453
Semiconductor Device
Semiconductor Device Having Groove-Shaped Via-Hole
Semiconductor Device Having Groove-Shaped Via-Hole
Semiconductor Device Having Groove-Shaped Via-Hole
Semiconductor Device Having Groove-Shaped Via-Hole
Semiconductor Device Having Groove-Shaped Via-Hole
Semiconductor Device Having Groove-Shaped Via-Hole
Semiconductor Device Having Groove-Shaped Via-Hole
Semiconductor Device Having Groove-Shaped Via-Hole
Semiconductor Device Having Groove-Shaped Via-Hole
Semiconductor Device Having Groove-Shaped Via-Hole
Semiconductor Device Having Groove-Shaped Via-Hole
Semiconductor Device
Semiconductor Device and Fabrication Method Thereof
Semiconductor Device and Method for Manufacturing the Same
Semiconductor Intergrated Circuit Apparatus and Manufacturing Method for Same
Capacitor Array, Ad Converter and Semiconductor Device
Semiconductor Device with High Breakdown Voltage and Manufacture Thereof
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 1, 2007
From: NAGAI, KOUICHI
To: FUJITSU LIMITED
Reel/Frame 019630/0439 →
Assignment of Assignor's Interest
Dec 9, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0089 →
Assignment of Assignor's Interest
Jun 16, 2010
From: TSUJI, MASAYUKI
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 024542/0339 →
Change of Name
Sep 27, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 025046/0478 →
Assignment of Assignor's Interest
Dec 23, 2010
From: MATSUKI, HIROHISA
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 025562/0710 →
Assignment of Assignor's Interest
Sep 6, 2011
From: TERASHIMA, HIROSHI; NAKAMURA, YASUKI; KUYA, RYO; YOSHINO, TATSUYA
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 026861/0010 →
Assignment of Assignor's Interest
Feb 15, 2012
From: OKADA, HIROKAZU
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 027710/0030 →
Assignment of Assignor's Interest
Jun 13, 2012
From: MATSUKI, HIROHISA; SAKUMA, MASAO
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 028367/0525 →
Assignment of Assignor's Interest
Jun 19, 2012
From: TAKENAKA, MASASHI; YAMAMOTO, KATSUYOSHI
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 028399/0104 →
Assignment of Assignor's Interest
Aug 1, 2012
From: FUJITA, TOMOYA; ASAMI, MARI; ONO, JUN
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 028694/0764 →
Assignment of Assignor's Interest
Aug 7, 2012
From: WATARAI, YUJI
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 028742/0267 →
Assignment of Assignor's Interest
Aug 9, 2012
From: YAMADA, TOMOYUKI; USHIDA, FUMIO; TAKEDA, SHIGETOSHI; AWAYA, TOMOHARU
To: FUJITSU LIMITED
Reel/Frame 028754/0271 →
Assignment of Assignor's Interest
Aug 13, 2012
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 028771/0242 →
Assignment of Assignor's Interest
Aug 14, 2012
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJISTU SEMICONDUCTOR LIMITED
Reel/Frame 028781/0785 →
Assignment of Assignor's Interest
Aug 20, 2012
From: KONNO, YOSHITO; YAMADA, YUTAKA
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 028812/0265 →
Assignment of Assignor's Interest
Aug 22, 2012
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 028828/0620 →
Assignment of Assignor's Interest
Nov 6, 2012
From: ABE, AKIO
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 029250/0032 →
Assignment of Assignor's Interest
Nov 7, 2012
From: IHARA, TAKUMI
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 029254/0038 →
Assignment of Assignor's Interest
Dec 12, 2012
From: TAKADA, KAZUHIKO
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 029452/0562 →
Assignment of Assignor's Interest
Dec 12, 2012
From: YANO, YUMA; TAJIMA, AKIMITSU; KONDO, HIDEAKI
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 029451/0049 →
Assignment of Assignor's Interest
Jan 11, 2013
From: SASAMURA, KEIICHI; MURATA, KOICHI; ISHIGURI, MASAHIKO; WATANABE, NAOYUKI
To: FUJITSU LIMITED
Reel/Frame 029614/0352 →
Assignment of Assignor's Interest
Mar 25, 2013
From: NOMOTO, RYUJI; YONEDA, YOSHIYUKI; NAKAMURA, KOICHI
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 030077/0940 →
Assignment of Assignor's Interest
Dec 30, 2014
From: OGAWA, HIROYUKI; YAMAGUCHI, AKIHISA
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 034598/0315 →
Assignment of Assignor's Interest
Jan 28, 2015
From: FUJITSU LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 034833/0956 →
Change of Name
Feb 25, 2015
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 035089/0853 →