IP Library Assignment 020471/0767
Patent Assignment
Reel/Frame 020471/0767

Assignment of Assignor's Interest

Recorded: 2008-02-06 Pages: 3
Assignors
KANEV, STOJAN
Executed: 2008-01-14
KIESEWETTER, JORG
Executed: 2008-01-11
Assignee
SUSS MICROTEC TEST SYSTEMS GMBH
SUSS-STRASSE 1, SACKA, 01561, GERMANY
Covered Property (1)
Method and Apparatus for Testing Electronic Components Within Horizontal and Vertical Boundary Lines of a Wafer
Patent: 7,659,743 →
Application: 11/947,206 →
Publication: US 2008/0180119
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Merger May 9, 2011
From: SUSS MICROTEC TEST SYSTEMS GMBH
To: CASCADE MICROTECH, INC.
Reel/Frame 026246/0706 →
Security Interest in United States Patents and Trademarks Jul 12, 2016
From: FORMFACTOR, INC.; ASTRIA SEMICONDUCTOR HOLDINGS, INC.; CASCADE MICROTECH, INC.; MICRO-PROBE INCORPORATED
To: HSBC BANK USA, NATIONAL ASSOCIATION
Reel/Frame 039184/0280 →
Release of Security Interest Aug 7, 2025
From: HSBC BANK USA, NATIONAL ASSOCIATION
To: FORMFACTOR, INC.
Reel/Frame 072853/0001 →