Patent Assignment
Reel/Frame 026246/0706
Merger
Recorded: 2011-05-09
Pages: 28
Assignor
SUSS MICROTEC TEST SYSTEMS GMBH
Executed: 2010-01-27
Assignee
CASCADE MICROTECH, INC.
2430 NW 206TH AVENUE, BEAVERTON, OREGON, 97006
Covered Properties
(47)
Non-Contact Measurement of Electrical Waveforms on the Surface of a Sample Using Time Domain Gating
Patent:
5,959,447 →
Application:
09/020,173 →
Arrangement for the Testing of Semiconductor Structures
Patent:
6,373,272 →
Application:
09/142,391 →
Scanning Force Microscope Probe Cantilever with Reflective Structure
Patent:
6,298,715 →
Application:
09/471,467 →
Method and Apparatus for Sub-Micron Imaging and Probing on Probe Station
Patent:
6,377,066 →
Application:
09/610,668 →
Tester for Pressure Sensors
Substrate-Holding Device for Testing Circuit Arrangements on Substrates
Test Apparatus for Testing Substrates at Low Temperatures
Test Apparatus with Loading Device
Calibration Method for Carrying Out Multiport Measurements on Semiconductor Wafers
Method and Prober for Contacting a Contact Area with a Contact Tip
Apparatus for Testing Substrates
Probe Station Comprising a Bellows with Emi Shielding Capabilities
Device for Testing Thin Elements
Procedure for Reproduction of a Calibration Position of an Aligned and Afterwards Displaced Calibration Substrate in a Probe Station
Test Probe for High-Frequency Measurement
Adapter for Positioning of Contact Tips
Probe Holder for a Probe for Testing Semiconductor Components
Probe Receptacle for Mounting a Probe for Testing Semiconductor Components, Probe Holder Arm and Test Apparatus
Probe Holder for a Probe for Testing Semiconductor Components
Method for Measurement of a Device Under Test
Method and Apparatus for Controlling the Temperature of Electronic Components
Probe Support with Shield for the Examination of Test Substrates Under Use of Probe Supports
Probe Station for Testing Semiconductor Substrates and Comprising Emi Shielding
Method for Calibration of a Vectorial Network Analyzer
Method for Calibration of a Vectorial Network Analyzer Having More Than Two Ports
Probe Station and Method for Measurements of Semiconductor Devices Under Defined Atmosphere
Device for Rapidly Changing Objectives with the Aid of Threaded Fastening
Method and Apparatus for Testing Electronic Components Within Horizontal and Vertical Boundary Lines of a Wafer
Micromanipulator for Moving a Probe
Application:
12/022,261 →
Publication:
US 2009/0049944
Method for Determining Measurement Errors in Scattering Parameter Measurements
Application:
12/030,295 →
Publication:
US 2008/0195344
Chuck with Triaxial Construction
Method and Apparatus for Control of a Positioning Device
Application:
12/111,222 →
Publication:
US 2008/0284457
Prober for Testing Magnetically Sensitive Components
Apparatus and Method for Assembling Several Semiconductor Devices Onto a Target Substrate
Application:
12/199,401 →
Publication:
US 2010/0011569
Method and Arrangement for Positioning a Probe Card
Prober for Testing Devices in a Repeat Structure on a Substrate
Method for Determination of Electrical Properties of Electronic Componets and Method for Calibration of a Measuring Unit
Application:
12/488,702 →
Publication:
US 2009/0314051
Chuck for Supporting and Retaining a Test Substrate and a Calibration Substrate
Probe for Temporarily Electrically Contacting a Solar Cell
Application:
12/539,177 →
Publication:
US 2010/0045264
Method and Device for Forming a Temporary Electrical Contact to a Solar Cell
Application:
12/541,530 →
Publication:
US 2010/0045265
Process for Measuring the Impedance of Electronic Circuits
Application:
12/609,155 →
Publication:
US 2010/0106439
Method for Increasing the Accuracy of the Positioning of a First Object Relative to a Second Object
Method for Testing a Test Substrate Under Defined Thermal Conditions and Thermally Conditionable Prober
Probe Holder
Probe Station for on-Wafer-Measurement Under Emi-Shielding
Arrangement and Method for Image Acquisition on a Prober
Application:
12/847,308 →
Publication:
US 2011/0181710
Arrangement and Method for Focusing a Multiplane Image Acquisition on a Prober
Related Assignments
(21)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Feb 12, 2004
From: STOLL, KARSTEN; KREIBIG, STEFAN; WACHTVEITL, ALF; TEICH, MICHAEL
To: SUSS MICROTEC TESTSYSTEMS (GMBH)
Reel/Frame 014969/0075 →
Assignment of Assignor's Interest
Aug 13, 2004
From: HEUERMANN, HOLGER
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 015672/0682 →
Assignment of Assignor's Interest
Sep 27, 2004
From: SCHNEIDEWIND, STEFAN; DIETRICH, CLAUS; KIESEWETTER, JORG; KANEV, STOJAN
To: SUSS MICROTEC TEST SYSTEMS (GMBH)
Reel/Frame 015818/0557 →
Assignment of Assignor's Interest
Oct 18, 2004
From: MFI TECHNOLOGIES CORPORATION
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 015896/0242 →
Assignment of Assignor's Interest
Dec 27, 2004
From: SCHNEIDEWIND, STEFAN; DIETRICH, CLAUS; WERNER, FRANK-MICHAEL; FEUERSTEIN, DON
To: SUSS MICROTEC TESTSYSTEMS (GMBH)
Reel/Frame 016100/0484 →
Assignment of Assignor's Interest
Feb 16, 2006
From: KREISSIG, STEFAN; KIESEWETTER, JOERG
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 017179/0181 →
Assignment of Assignor's Interest
Feb 16, 2006
From: GRAUER, STEFFEN; BEIER, UWE; RUNGE, DIETMAR; KREISSIG, STEFAN
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 017179/0555 →
Assignment of Assignor's Interest
Feb 27, 2006
From: SCHNEIDEWIND, STEFAN; DIETRICH, CLAUS; KIESEWETTER, JORG; WERNER, FRANK-MICHAEL
To: SUSS MICROTEC TESTSYSTEMS (GMBH)
Reel/Frame 017604/0844 →
Corrective Assignment to Correct the Property Number from 11/299,487 to 11/314,624 and the Docket Number from 2642.021 to 2642.022 Previously Recorded on Reel 017179 Frame 0555. Assignor(S) Hereby Confirms the Assignment of Entire Interest..
Mar 6, 2006
From: BEIER, UWE; RUNGE, DIETMAR; KREISSIG, STEFAN; GRAUER, STEFFEN
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 017254/0926 →
Corrective Assignment to Correct the Property Number from 11/314,624 to 11/299,487 and the Docket Number from 2642.022 to 2642.021 Previously Recorded on Reel 017179 Frame 0181. Assignor(S) Hereby Confirms the Assignment of Entire Interest..
Mar 6, 2006
From: KREISSIG, STEFAN; KIESEWETTER, JOERG
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 017254/0922 →
Assignment of Assignor's Interest
May 8, 2006
From: SCHOTT, STEFFEN; KANEV, STOJAN
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 017588/0214 →
Assignment of Assignor's Interest
May 9, 2006
From: KIESEWETTER, JOERG; SCHMIDT, AXEL; KREISSIG, STEFAN; STOLL, KARSTEN
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 017592/0856 →
Assignment of Assignor's Interest
Oct 30, 2006
From: SCHOTT, STEFFEN; KREISSIG, STEFAN; RUNGE, DIETMAR; BECKER, AXEL
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 018453/0363 →
Assignment of Assignor's Interest
Apr 13, 2007
From: FLEISCHER, HANS-JURGEN; SCHMIDT, AXEL; KANEV, STOJAN, DR.; BECKER, AXEL
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 019157/0104 →
Assignment of Assignor's Interest
Apr 13, 2007
From: RUNGE, DIETMAR; KANEV, STOJAN, DR.; DIETRICH, CLAUS
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 019156/0982 →
Assignment of Assignor's Interest
Mar 4, 2010
From: RUMIANTSEV, ANDREJ
To: SUSS MICROTEC TEST SYSTEMS GMBH
Reel/Frame 024025/0928 →
Security Interest in United States Patents and Trademarks
Jul 12, 2016
From: FORMFACTOR, INC.; ASTRIA SEMICONDUCTOR HOLDINGS, INC.; CASCADE MICROTECH, INC.; MICRO-PROBE INCORPORATED
To: HSBC BANK USA, NATIONAL ASSOCIATION
Reel/Frame 039184/0280 →
Change of Name
Jul 18, 2018
From: CASCADE MICROTECH, INC.
To: FORMFACTOR BEAVERTON, INC.
Reel/Frame 046573/0664 →
Assignment of Assignor's Interest
Sep 1, 2021
From: FORMFACTOR BEAVERTON, INC.
To: FORMFACTOR, INC.
Reel/Frame 057393/0609 →
Security Interest
Jul 29, 2025
From: FORMFACTOR, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 072263/0272 →
Release of Security Interest
Aug 7, 2025
From: HSBC BANK USA, NATIONAL ASSOCIATION
To: FORMFACTOR, INC.
Reel/Frame 072853/0001 →