Method for measurement of a device under test
View Patent ↗A method is disclosed for measurement of wafers and other semiconductor components in a probe station, which serves for examination and testing of electronic components. The device under test is held by a chuck and at least one electric probe by a probe support and the device under test and the probe are selectively positioned relative to each other by a positioning device with electric drives and the device under test is contacted. The drive of the positioning device remains in a state of readiness until establishment of contact and is switched off after establishment of contact and before measurement of the device under test.
1. Method for measurement of a device under test comprising the steps of:
a) holding of the device under test by a chuck,
b) holding of at least one electric probe by a probe support,
c) positioning of the device under test or the at least one electric probe relative to each other by a positioning device with electric drives so that the at least one electric probe is opposite and spaced from a contact surface of the device under test,
d) advancing the device under test or the at least one electric probe relative to each other by the positioning device to establish contact between the contact surface and the at least one electric probe,
e) wherein a drive of the positioning device remains in a state of readiness until said contact is established between the device under test and the at least one electric probe, and current is applied on the drive and the drive executes no movement,
f) switching off of the drive of the positioning device after establishment of said contact, and
g) measuring of the device under test.
2. Method for measurement of claim 1 , wherein the drive of the positioning device includes more than one motor and each motor remains in the state of readiness until establishment of said contact and is switched off after establishment of said contact.
3. Method for measurement of claim 1 , wherein at least one of the positioning or advancing occurs in several partial steps.
4. Method for measurement of claim 1 , further comprising:
a) observing at least one of said positioning and said advancement using an optical device in which the optical device is moved by a movement device comprising a movement device electric drive,
b) wherein said movement device electric drive remains in a state of readiness until establishment of said contact and
c) switching off of the movement device electric drive after establishment of said contact and before measurement of the device under test.
5. Method for measurement of claim 1 , wherein the positioning device includes a control unit and a signal is generated in the control unit for switching off of the drive of the positioning device.
6. Method for measurement of claim 4 , wherein the movement device further comprises a control unit and a signal is generated in the control unit to switch off the movement device electric drive.
7. Method for measurement of a device under test comprising the steps of:
a) holding of the device under test by a chuck,
b) holding of at least one electric probe by a probe support,
c) positioning of the device under test or the at least one electric probe relative to each other by a positioning device with at least one speed-controlled motor so that the at least one electric probe is opposite and spaced from a contact surface of the device under test,
d) advancing of the device under test or the at least one electric probe relative to each other by the positioning device to establish contact between the contact surface and the at least one electric probe,
e) wherein the drive of the positioning device remains in a state of readiness until contact is established between the device under test and the at least one electric probe, and current is applied on the motor and the motor executes no movement,
f) switching off of the motor of the positioning device after establishment of said contact, and
g) measuring of the device under test.
8. Method for measurement of claim 7 , further comprising:
a) observing at least one of the positioning or advancement by an optical device in which the optical device is moved by a movement device comprising a movement device electric drive,
b) wherein said movement device electric drive remains in a state of readiness until establishment of said contact between the device under test and probe, and
c) switching off of the movement device electric drive after establishment of said contact and before measurement of the device under test.
9. Method for measurement of claim 7 , wherein the positioning device includes a control unit and a signal is generated in the control unit to switch off the motor of the positioning device.
10. Method for measurement of claim 8 , wherein the movement device further comprises a control unit and a signal is generated in the control unit to switch off the movement device electric drive.
11. Method for measurement of claim 8 , wherein the movement device electric drive comprises a speed-controlled motor.
12. Method for measurement of claim 4 , wherein the optical device is operated electronically and is switched off after establishment of said contact and before measurement of the device under test.
13. Method for measurement of claim 1 , wherein a housing encloses said positioning device, and at least one of said chuck and said probe support.
14. Method for measurement of claim 8 , wherein the optical device is operated electronically and is switched off after establishment of said contact and before measurement of the device under test.
15. Method for measurement of claim 7 , wherein a housing encloses said positioning device, and at least one of said chuck and said probe support.