Apparatus for testing substrates
View Patent ↗An apparatus for testing substrates reduces the area required and the costs which arise with the testing of substrates, in particular semiconductor wafers, during the production process. The apparatus includes testing arrangements comprising a chuck, a chuck drive, control electronics, probe or probe board holding means with a handling system, a substrate magazine station and an alignment station. The testing arrangements include at least two testing arrangements, both of which are all jointly operatively connected to the handling system, the substrate magazine station and the alignment station.
1. An apparatus for electrical testing of finished devices or circuits fabricated on substrates, the apparatus comprising shareable components namely a shareable handling system, a shareable substrate magazine station and shareable alignment station, and at least two electrical test arrangements for electrical testing of the finished devices or circuits fabricated on substrates, each test arrangement comprising a chuck, a chuck drive, control electronics, probe or probe board holding means, wherein the at least two electrical test arrangements are all jointly operatively connected to the shareable handling system, the shareable substrate magazine station and the shareable alignment station, so that substrate handling for the at least two electrical test arrangements is provided exclusively by a common shareable component which is connected to both electrical test arrangements.
2. The apparatus according claim 1 , characterized in that the shareable handling system, the shareable substrate magazine station and the shareable alignment station are arranged in a common module which is less than a whole of the apparatus for electrical testing of devices fabricated on substrates and is connected to the at least two electrical test arrangements.
3. The apparatus according to claim 1 , wherein each of the at least two test arrangements is constructed as a separate module.
4. The apparatus according claim 3 further characterized in that each separate module has the same basic grid dimensions and each separate module can be connected to each other.
5. The apparatus according claim 3 further characterized in that each separate module is designed such that it can be moved and locked in an operational position.
6. The apparatus according claim 3 further characterized in that each separate module is arranged on a vibration-insulating, preferably position-controlled platform.
7. The apparatus according claim 6 further characterized in that each separate module is arranged on a separate platform from the other modules.
8. The apparatus according claim 6 further characterized in that a common housing is provided, into which the test arrangements, the shareable handling system, the shareable substrate magazine station and the shareable alignment station are housed.
9. The apparatus according claim 1 further characterized in that all the test arrangements are arranged around at least one of the shareable handling system and the shareable alignment station.
10. The apparatus according claim 1 further comprising a removable test arrangement.
11. The apparatus according claim 1 further characterized in that at least one test arrangement further comprises additional equipment.