Probe holder for a probe for testing semiconductor components
View Patent ↗A probe holder in which the probe needle has a slight horizontal offset under the action of a vertical force comprises a probe holder for a probe needle, wherein the holder is adapted, for fastening and electrical contact-connection, on a carrier device of a test apparatus and has a holder arm having a needle holder at the free end thereof to fasten the probe needle, and a fastening arm for connecting the holder arm to the carrier device. The holder arm and fastening arm are connected to one another by a parallel guide whereby horizontal offset of the needle tip on account of external forces can be reduced or even prevented making it easier for the probe needle to carry out a vertical yielding movement, with almost no rotation of the probe needle about a horizontal axis.
1. A probe holder for a probe needle, said holder being adapted for fastening and electrical contact-connection on a carrier device of a test apparatus and said holder comprises a holder arm having a needle holder arranged at a free end of the holder arm to fasten the probe needle, and a fastening arm for connecting the probe holder to the carrier device, wherein the holder arm and the fastening arm are connected to one another by a parallel guide that minimizes rotation of the probe needle;
wherein the parallel guide comprises at least two elongated connecting elements which are arranged parallel to one another and at a distance from one another, and are each connected, at one end, to the holder arm, and, at another end, to the fastening arm; and
wherein at least one connecting element is articulatedly connected at at least one end.
2. The probe holder as claimed in claim 1 , wherein at least one connecting element is rigidly mounted at least on one end.
3. The probe holder as claimed in claim 1 , further comprising at least one spring element for generating a restoring force at the parallel guide.
4. The probe holder as claimed in claim 1 , wherein at least one connecting element is in the form of a strip.
5. The probe holder as claimed in claim 1 , wherein at least one connecting element comprises a metallic material.
6. The probe holder as claimed in claim 1 , wherein the parallel guide causes translatory movement of the holder arm and the probe needle without a rotary movement component as an external vertical force acts on the probe needle.
7. The probe holder as claimed in claim 1 , wherein the parallel guide minimizes rotation of the probe needle about an axis of the holder arm.
8. The probe holder as claimed in claim 1 , wherein the holder arm comprises an elongated element.
9. The probe holder as claimed in claim 8 , wherein the holder arm comprises an elongated element having a length and a thickness.
10. The probe holder as claimed in claim 1 , wherein the holder arm comprises an elongated element extending substantially parallel to the at least two elongated connecting elements.
11. The probe holder as claimed in claim 1 , wherein the holder arm comprises a first end mounted to the parallel guide and a second, free end having the needle holder.
12. The probe holder as claimed in claim 1 , wherein the holder arm and the needle are distinct structures.
13. The probe holder as claimed in claim 1 , wherein the fastening arm, the parallel guide, and the holder arm each comprise elongated structures having a first end and a second end, and wherein the first end of the fastening arm is mounted to the carrier device, the first end of the parallel guide is mounted to the second end of the fastening arm, and the first end of the holder arm is mounted to the second end of the parallel guide.
14. The probe holder as claimed in claim 1 , wherein articulatedly mounted comprises mounted in an articulated manner.
15. The probe holder as claimed in claim 1 , wherein the parallel guide minimizes rotation of the probe needle about a horizontal axis perpendicular to an axis of the holder arm.