Arrangement and method for focusing a multiplane image acquisition on a prober
View Patent ↗A focused multi-planar image acquisition in real time even while a test object is moving, is achieved with a system and a method for a focused multi-planar image acquisition in a prober. When a surface of a test object is positioned laterally in relation to tips of separated probe needles, a microscope is focused on the surface of the test object at a first time and on a plane of the probe needles at a second time. The objective lens is provided with a microscope objective lens focusing system, which can focus the objective lens, independently of a vertical adjustment drive of the microscope, on the surface of the test object in a first focal plane and in a second focal plane, which is on a level with the probe needle tips.
1. System for a focused multi-planar image acquisition in a prober comprising a movement device; a clamping fixture mounted on said movement device and adapted for clamping a test object; probe needles, which can make contact with the test object; holding devices for the probe needles; a clamping plate arranged above the clamping fixture and on which the holding devices are mounted and which has a viewing aperture, which visibly exposes a surface of the test object; and an image capturing device mounted over the viewing aperture and connected to an image evaluating unit, the image capturing device comprising a microscope with an objective lens and an objective holder and provided with a lighting device to produce a light beam, directed on the surface of the test object, wherein the objective lens is provided with a microscope objective lens focusing system to focus the objective lens, independently of a vertical adjustment drive of the microscope, on the surface of the test object in a first focal plane and in a second focal plane, which is on a level with tips of the probe needle, wherein the microscope comprises a confocal microscope.
2. Method for a focused multi-planar image acquisition in a prober, wherein, when a surface of a test object is positioned laterally in relation to tips of separated probe needles, a microscope is focused on a surface of the test object at a first time and on a plane of the probe needles at a second time, wherein an objective lens of the microscope is focused, independently of a vertical adjustment of the microscope, on the surface and the plane at different times; and during positioning, respective focus settings on the objective lens are changed multiple times, wherein the images captured by the microscope are captured by a video camera and displayed on a screen, wherein the images captured by the video camera are fed to an image evaluating unit; and at least two sequential images, captured with different focus settings, are stored and are displayed in the display so as to be projected one over another.
3. Method for a focused multi-planar image acquisition in a prober, wherein, when a surface of a test object is positioned laterally in relation to tips of separated probe needles, a microscope is focused on a surface of the test object at a first time and on a plane of the probe needles at a second time, wherein an objective lens of the microscope is focused, independently of a vertical adjustment of the microscope, on the surface and the plane at different times; and during positioning, respective focus settings on the objective lens are changed multiple times, wherein the focus settings are changed in such a manner that several images of the test object are taken with an illumination, a color of the illumination varying with respective images; and then an image of the tips of the probe needles is captured; and that one image is assembled from the images of the test object by projecting the image of the tips of the probe needles into said image.
4. Method, as claimed in claim 3 , wherein, when an image is captured in a different luminous color, a focus setting optimized for sharpness with respect to the luminous color is carried out at the objective lens.