Probe station comprising a bellows with EMI shielding capabilities
View Patent ↗A probe station allows for effective EMI shielding of the passage of the probe through the wall of the housing of such probe station. The probe is freely movable in the X, Y and Z directions. The probe station comprises a housing having at least one aperture through which a probe can extend, a chuck for supporting a test device, the chuck being arranged inside the housing, at least one probe support for supporting a probe, the probe support being arranged relative to the housing such that a first portion of the probe extends into the housing through one of said apertures, at least one positioning mechanism enabling at least one of said probe and said chuck to move relative to the other, and is characterized in that at least one electrically conductive, elastic bellows is attached to the edge of an aperture which provides a variable passage for the probe.
1. A probe station comprising:
(a) a probe;
(b) a housing having an opening in a top wall of the housing through which the probe extends;
(c) a covering structure covering the opening and having an aperture through which the probe extends;
(d) a chuck for supporting a test device, the chuck being arranged inside the housing;
(e) a probe support for supporting the probe, the probe support being arranged external to the covering structure such that a first portion of the probe extends into the covering structure through said aperture;
(f) a positioning mechanism enabling at least one of said probe and said chuck to move relative to the other; and
(g) an electrically conductive, elastic bellows, the elastic bellows being attached to an edge of the aperture and the bellows providing an EMI shielded variable passage for the probe.
2. The probe station of claim 1 wherein the probe is entirely enclosed by the elastic bellows in the space between the probe support and the aperture.
3. The probe station of claim 2 wherein the elastic bellows is of substantially tubular shape, entirely enclosing a second portion of the probe in the space between the probe support and the aperture.
4. The probe station of claim 1 wherein the probe is partially enclosed by the elastic bellows in the space between the probe support and the aperture.
5. The probe station of claim 4 wherein the elastic bellows is of substantially conical shape, an apex of the cone having an opening which closely surrounds the probe.
6. The probe station of claim 1 wherein the elastic bellows is a substantially flat, plate-like membrane, having an opening which closely surrounds the probe.
7. The probe station of claim 1 wherein the elastic bellows is pleated.
8. The probe station of claim 1 wherein a material of the elastic bellows is a metal.
9. The probe station of claim 1 wherein a material of the elastic bellows is a silicone graphite compound.
10. The probe station of claim 1 wherein a material of the elastic bellows is a rubber graphite compound.
11. The probe station of claim 1 wherein the elastic bellows has a metal coating.
12. The probe station of claim 1 wherein the elastic bellows has a metal coating which comprises at least two layers of different metals.
13. The probe station of claim 1 wherein the elastic bellows has a metal coating which is covered by a protective layer of elastic material.
14. The probe station of claim 1 wherein the elastic bellows is made of a composite material containing an electrically conductive, textile core embedded in an elastic material.
15. The probe station of claim 1 wherein the elastic bellows is made of a composite material containing an electrically conductive, textile core embedded in an elastic material and the textile core is a metal plated fabric of synthetic fibers.
16. The probe station of claim 1 wherein the elastic bellows is electrically connected to the housing.
17. The probe station of claim 1 wherein the elastic bellows is electrically connected to the probe.
18. The probe station of claim 1 wherein the elastic bellows is electrically connected to the probe support.