IP Library › Assignment 020938/0473
Patent Assignment
Reel/Frame 020938/0473

Assignment of Assignor's Interest

Recorded: 2008-05-13 Pages: 2
Assignors
SU, CHANMIN
Executed: 2008-05-12
PRATER, CRAIG
Executed: 2008-05-12
Assignee
VEECO INSTRUMENTS INC.
1 TERMINAL DRIVE, PLAINVIEW, NEW YORK, 11803
Covered Property (1)
Non-Destructive Wafer-Scale Sub-Surface Ultrasonic Microscopy Employing Near Field Afm Detection
Patent: 8,322,220 →
Application: 12/119,382 →
Publication: US 2008/0276695
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 28, 2010
From: VEECO INSTRUMENTS INC.
To: VEECO METROLOGY INC.
Reel/Frame 025051/0290 →
Change of Name Oct 24, 2011
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 027111/0461 →