IP Library Assignment 021368/0657
Patent Assignment
Reel/Frame 021368/0657

Assignment of Assignor's Interest

Recorded: 2008-08-11 Pages: 4
Assignors
KONNO, TAKASHI
Executed: 2008-07-25
YASUTAKE, MASATOSHI
Executed: 2008-07-15
Assignees
AOI ELECTRONICS CO., LTD.
455-1, KOHZAI-MINAMIMACHI, TAKAMATSU-SHI, KAGAWA, JAPAN
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, JAPAN
Covered Property (1)
Tweezer-Equipped Scanning Probe Microscope and Transfer Method
Patent: 7,987,703 →
Application: 12/130,311 →
Publication: US 2008/0295585
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Aug 5, 2019
From: SII NANO TECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 049952/0649 →
Assignment of Assignor's Interest Aug 5, 2019
From: AOI ELECTRONICS CO., LTD.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 049952/0676 →
Change of Address Aug 5, 2019
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 049952/0787 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →