IP Library Assignment 049952/0676
Patent Assignment
Reel/Frame 049952/0676

Assignment of Assignor's Interest

Recorded: 2019-08-05 Pages: 3
Assignor
AOI ELECTRONICS CO., LTD.
Executed: 2019-01-30
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU,, TOKYO,, JAPAN
Covered Property (1)
Tweezer-Equipped Scanning Probe Microscope and Transfer Method
Patent: 7,987,703 →
Application: 12/130,311 →
Publication: US 2008/0295585
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 11, 2008
From: KONNO, TAKASHI; YASUTAKE, MASATOSHI
To: AOI ELECTRONICS CO., LTD.; SII NANO TECHNOLOGY INC.
Reel/Frame 021368/0657 →
Change of Name Aug 5, 2019
From: SII NANO TECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 049952/0649 →
Change of Address Aug 5, 2019
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 049952/0787 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →