Patent Assignment
Reel/Frame 049952/0649
Change of Name
Recorded: 2019-08-05
Pages: 16
Assignor
SII NANO TECHNOLOGY INC.
Executed: 2013-01-11
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI,, CHIBA,, JAPAN
Covered Property
(1)
Tweezer-Equipped Scanning Probe Microscope and Transfer Method
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 11, 2008
From: KONNO, TAKASHI; YASUTAKE, MASATOSHI
To: AOI ELECTRONICS CO., LTD.; SII NANO TECHNOLOGY INC.
Reel/Frame 021368/0657 →
Assignment of Assignor's Interest
Aug 5, 2019
From: AOI ELECTRONICS CO., LTD.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 049952/0676 →
Change of Address
Aug 5, 2019
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 049952/0787 →
Change of Address
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →