IP Library Assignment 022388/0109
Patent Assignment
Reel/Frame 022388/0109

Assignment of Assignor's Interest

Recorded: 2009-03-12 Pages: 4
Assignor
TIMBRE TECHNOLOGIES, INC.
Executed: 2009-03-12
Assignee
TOKYO ELECTRON LIMITED
AKASAKA BIZ TOWER, 3-1 AKASAKA 5-CHOME, MINATO-KU, TOKYO, 107-6325, JAPAN
Covered Properties (15)
Diffraction order selection for optical metrology simulation
Application: 10/290,792 →
Publication: US 2004/0090629
Approximating Eigensolutions for Use in Determining the Profile of a Structure Formed on a Semiconductor Wafer
Patent: 7,630,873 →
Application: 10/375,708 →
Publication: US 2004/0167754
Optical metrology of structures formed on semiconductor wafer using machine learning systems
Application: 10/608,300 →
Publication: US 2004/0267397
Selecting a Profile Model for Use in Optical Metrology Using a Machine Learining System
Patent: 7,523,076 →
Application: 10/791,046 →
Publication: US 2005/0192914
Shape roughness measurement in optical metrology
Application: 10/856,002 →
Publication: US 2005/0275850
Controlling Critical Dimensions of Structures Formed on a Wafer in Semiconductor Processing
Patent: 7,566,181 →
Application: 10/933,028 →
Publication: US 2006/0046166
Modeling and Measuring Structures with Spatially Varying Properties in Optical Metrology
Patent: 7,515,282 →
Application: 11/173,198 →
Publication: US 2007/0002337
Selecting unit cell configuration for repeating structures in optical metrology
Application: 11/218,884 →
Publication: US 2006/0187466
Weighting Function to Enhance Measured Diffraction Signals in Optical Metrology
Patent: 7,523,021 →
Application: 11/371,752 →
Publication: US 2007/0211260
Optical Metrology Model Optimization Based on Goals
Patent: 7,588,949 →
Application: 11/699,837 →
Publication: US 2007/0135959
Generic Interface for an Optical Metrology System
Patent: 7,450,232 →
Application: 11/856,651 →
Publication: US 2008/0037017
Library Accuracy Enhancment and Evaluation
Patent: 7,617,075 →
Application: 11/946,821 →
Publication: US 2008/0071504
Optical Metrology Model Optimization for Repetitive Structures
Application: 12/099,735 →
Publication: US 2008/0195342
Optical Metrology Optimization for Repetitive Structures
Patent: 7,616,325 →
Application: 12/140,627 →
Publication: US 2008/0285054
Transforming Metrology Data from a Semiconductor Treatment System Using Multivariate Analysis
Patent: 8,170,833 →
Application: 12/336,435 →
Publication: US 2009/0094001
Related Assignments (20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 8, 2002
From: DREGE, EMMANUEL; DODDI, SRINIVAS; VUONG, VI; BAO, JUNWEI
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 013498/0913 →
Assignment of Assignor's Interest Feb 26, 2003
From: BISCHOFF, JOERG; HEHL, KARL; NIU, XINHUI; JIN, WEN
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 013833/0147 →
Assignment of Assignor's Interest Jun 27, 2003
From: DODDI, SRINIVAS; DREGE, EMMANUEL; JAKATDAR, NICKHIL; BAO, JUNWEI
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 014257/0857 →
Assignment of Assignor's Interest Mar 1, 2004
From: DREGE, EMMANUEL; DODDI, SRINVAS; BAO, JUNWEI
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 015052/0289 →
Assignment of Assignor's Interest May 28, 2004
From: BISCHOFF, JOERG
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 015406/0139 →
Assignment of Assignor's Interest Aug 3, 2004
From: NIU, XINHUI
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 015041/0401 →
Assignment of Assignor's Interest Sep 2, 2004
From: YANG, WENGE; NOLET, ALAN
To: TIMBRE TECHNOLOGIES INC.
Reel/Frame 015764/0484 →
Assignment of Assignor's Interest Jul 1, 2005
From: LI, SHIFANG; VUONG, VI; NOLET, ALAN; BAO, JUNWEI
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 016760/0367 →
Assignment of Assignor's Interest Nov 14, 2005
From: LI, SHIFANG; KOMAROV, SERGUEI; MIYAGI, MAKOTO; RABELLO, SYLVIO
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 017010/0974 →
Assignment of Assignor's Interest Mar 9, 2006
From: VUONG, VI; BAO, JUNWEI; LI, SHIFGANG; CHEN, YAN
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 017668/0671 →
Record to Add the Assignor's Name, Previously Recorded on Reel 017010, Frame 0974. Sep 26, 2006
From: LI, SHIFANG; KOMAROV, SERGUEI; MIYAGI, MAKOTO; RABELLO, SYLVIO
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 018309/0921 →
Assignment of Assignor's Interest Nov 16, 2007
From: LI, SHIFANG; BAO, JUNWEI; JAKATDAR, NICKHIL; NIU, XINHUI
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 020127/0026 →
Assignment of Assignor's Interest Nov 23, 2007
From: TANAKA, SATOSHI; FUKUDA, MAKOTO; HOSHI, SATOSHI
To: FUJIFILM CORPORATION
Reel/Frame 020149/0026 →
Assignment of Assignor's Interest Mar 3, 2008
From: VUONG, VI; DREGE, EMMANUEL; LI, SHIFANG; BAO, JUNWEI
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 020591/0342 →
Assignment of Assignor's Interest Mar 25, 2008
From: LI, SHIFANG; BAO, JUNWEI; LIU, WEI
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 020700/0050 →
Assignment of Assignor's Interest Jul 10, 2008
From: VUONG, VI; BAO, JUNWEI; BISCHOFF, JOERG
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 021220/0315 →
Assignment of Assignor's Interest Aug 27, 2008
From: LI, SHIFANG; BAO, JUNWEI; QIU, HONG; LIU, VICTOR
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 021452/0108 →
Assignment of Assignor's Interest Mar 10, 2009
From: VUONG, VI; BAO, JUNWEI; CHEN, YAN; HEIKO, WEICHERT
To: TIMBRE TECHNOLOGIES, INC.
Reel/Frame 022374/0180 →
Assignment of Assignor's Interest Mar 12, 2009
From: TIMBRE TECHNOLOGIES, INC.
To: TOKYO ELECTRON LIMITED
Reel/Frame 022380/0773 →
Assignment of Assignor's Interest Jun 24, 2009
From: TIMBRE TECHNOLOGIES, INC.
To: TOKYO ELECTRON LIMITED
Reel/Frame 022871/0409 →