Patent Assignment
Reel/Frame 022879/0114
Assignment of Assignor's Interest
Recorded: 2009-06-26
Pages: 48
Assignors
GASTALDO, PHILIPPE
Executed: 2008-11-21
BERGER, FRANCOIS
Executed: 2008-11-21
DELCARRI, JEAN-LUC
Executed: 2008-11-21
BELIN, PATRICE
Executed: 2005-12-29
Assignee
ALTATECH SEMICONDUCTOR
611 RUE ARISTIDE BERGES, ZAC DE PRE MILLET, MONTBONNOT SAINT MARTIN, 38330, FRANCE
Covered Property
(1)
Method for Detecting Surface Defects on a Substrate and Device Using Said Method
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 26, 2009
From: MOULIN, CECILE; MORITZ, SOPHIE
To: S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES
Reel/Frame 022879/0162 →
Assignment of Assignor's Interest
May 25, 2016
From: MALEVILLE, CHRISTOPHE
To: SOITEC
Reel/Frame 038716/0956 →
Change of Name
May 25, 2016
From: S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES
To: SOITEC
Reel/Frame 038809/0702 →
Assignment of Assignor's Interest
Feb 16, 2018
From: SOITEC
To: ALCATECH SEMICONDUCTOR
Reel/Frame 044953/0055 →
Change of Name
Feb 16, 2018
From: ALCATECH SEMICONDUCTOR
To: UNITY SEMICONDUCTOR
Reel/Frame 045909/0059 →