Patent Assignment
Reel/Frame 022879/0162
Assignment of Assignor's Interest
Recorded: 2009-06-26
Pages: 5
Assignee
S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES
PARC TECHNOLOGIQUE DES FONTAINES, CHEMIN DES FRANQUES, BERNIN, 38190, FRANCE
Covered Property
(1)
Method for Detecting Surface Defects on a Substrate and Device Using Said Method
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 26, 2009
From: GASTALDO, PHILIPPE; BERGER, FRANCOIS; DELCARRI, JEAN-LUC; BELIN, PATRICE
To: ALTATECH SEMICONDUCTOR
Reel/Frame 022879/0114 →
Assignment of Assignor's Interest
May 25, 2016
From: MALEVILLE, CHRISTOPHE
To: SOITEC
Reel/Frame 038716/0956 →
Change of Name
May 25, 2016
From: S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES
To: SOITEC
Reel/Frame 038809/0702 →
Assignment of Assignor's Interest
Feb 16, 2018
From: SOITEC
To: ALCATECH SEMICONDUCTOR
Reel/Frame 044953/0055 →
Change of Name
Feb 16, 2018
From: ALCATECH SEMICONDUCTOR
To: UNITY SEMICONDUCTOR
Reel/Frame 045909/0059 →