IP Library › Assignment 045909/0059
Patent Assignment
Reel/Frame 045909/0059

Change of Name

Recorded: 2018-02-16 Pages: 13
Assignor
ALCATECH SEMICONDUCTOR
Executed: 2016-07-18
Assignee
UNITY SEMICONDUCTOR
611 RUE ARISTIDE BERGÈS, MONTBONNOT-SAINT-MARTIN, 38330, FRANCE
Covered Property (1)
Method for Detecting Surface Defects on a Substrate and Device Using Said Method
Patent: 7,812,942 →
Application: 12/057,367 →
Publication: US 2009/0051930
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jun 26, 2009
From: GASTALDO, PHILIPPE; BERGER, FRANCOIS; DELCARRI, JEAN-LUC; BELIN, PATRICE
To: ALTATECH SEMICONDUCTOR
Reel/Frame 022879/0114 →
Assignment of Assignor's Interest Jun 26, 2009
From: MOULIN, CECILE; MORITZ, SOPHIE
To: S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES
Reel/Frame 022879/0162 →
Assignment of Assignor's Interest May 25, 2016
From: MALEVILLE, CHRISTOPHE
To: SOITEC
Reel/Frame 038716/0956 →
Change of Name May 25, 2016
From: S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES
To: SOITEC
Reel/Frame 038809/0702 →
Assignment of Assignor's Interest Feb 16, 2018
From: SOITEC
To: ALCATECH SEMICONDUCTOR
Reel/Frame 044953/0055 →