IP Library › Assignment 023086/0040
Patent Assignment
Reel/Frame 023086/0040

Re-Record to Correct the Address of the Assignee, Previously Recorded on Reel 018172 Frame 0631.

Recorded: 2009-08-13 Pages: 3
Assignors
OHSHIMA, YOSHIMASA
Executed: 2006-07-07
UTO, SACHIO
Executed: 2006-07-07
SHIBATA, YUKIHIRO
Executed: 2006-07-07
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Apparatus for Detecting Defects on a Wafer
Patent: 7,567,343 →
Application: 11/500,421 →
Publication: US 2007/0070337
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 8, 2006
From: OHSHIMA, YOSHIMASA; UTO, SACHIO; SHIBATA, YUKIHIRO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 018172/0631 →
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →