Patent Assignment
Reel/Frame 024026/0044
Assignment of Assignor's Interest
Recorded: 2010-02-22
Pages: 3
Assignor
ISHIZUKA, SATOSHI
Executed: 2010-02-12
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Semiconductor Device Test Circuit, Semiconductor Device, and Its Manufacturing Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.