Assignment of Assignor's Interest

Recorded: 2010-05-05 Pages: 2

Assignor

MURAOKA, HIROYUKI

Executed: 2010-04-12

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Test Method, Test Control Program and Semiconductor Device

Application: 12/774,002 →

Publication: US 2010/0332932

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.