Assignment of Assignor's Interest

Recorded: 2010-05-27 Pages: 3

Assignor

KANETA, KENJI

Executed: 2010-03-31

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Semiconductor Device and Method of Inspecting an Electrical Characteristic of a Semiconductor Device

Application: 12/787,815 →

Publication: US 2010/0301333

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.