Patent Assignment
Reel/Frame 024490/0803
Assignment of Assignor's Interest
Recorded: 2010-05-27
Pages: 4
Assignor
HAMANAKA, SHINSUKE
Executed: 2010-03-31
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Test System and Test Method of Semiconductor Integrated Circuit
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.