Patent Assignment
Reel/Frame 024498/0820
Assignment of Assignor's Interest
Recorded: 2010-05-27
Pages: 4
Assignor
SEYA, SHUNICHI
Executed: 2010-03-31
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Testing method for a semiconductor integrated circuit device, semiconductor integrated circuit device and testing system
Application:
12/801,210 →
Publication:
US 2010/0315116
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.