IP Library Assignment 025029/0669
Patent Assignment
Reel/Frame 025029/0669

Assignment of Assignor's Interest

Recorded: 2010-09-22 Pages: 3
Assignors
RUAN, WEI WEI
Executed: 2010-09-21
GONG, BIN
Executed: 2010-09-21
SHI, WEN
Executed: 2010-09-21
Assignee
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION
18 ZHANG JIANG ROAD, PUDONG NEW AREA, SHANGHAI, 201203, CHINA
Covered Property (1)
Structure and Method for Semiconductor Testing
Application: 12/887,491 →
Publication: US 2011/0074459
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 14, 2013
From: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION
To: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION; SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION
Reel/Frame 029625/0763 →