Assignment of Assignor's Interest

Recorded: 2010-09-30 Pages: 5

Assignor

VEECO INSTRUMENTS INC.

Executed: 2010-09-30

Assignee

VEECO METROLOGY INC.

112 ROBIN HILL ROAD, SANTA BARBARA, CALIFORNIA, 93117

Covered Properties (3)

Scanning Probe Microscope Having Automatic Probe Exchange and Alignment

Patent: 5,705,814 →

Application: 08/521,584 →

High Precision Optical Metrology Using Frequency Domain Interpolation

Patent: 6,314,212 →

Application: 09/260,599 →

Method and Apparatus for Measuring Electrical Properties in Torsional Resonance Mode

Patent: 7,757,544 →

Application: 11/619,097 →

Publication: US 2007/0163335

Related Assignments (3)

Other recorded transfers of the patents in this record — the chain of ownership.