IP Library Assignment 026587/0811
Patent Assignment
Reel/Frame 026587/0811

Change of Name

Recorded: 2011-07-14 Pages: 2
Assignor
Assignee
CHARTERED SEMICONDUCTOR MANUFACTURING PTE. LTD.
60 WOODLANDS INDUSTRIAL PARK D STREET 2, SINGAPORE, 738406, SINGAPORE
Covered Property (1)
Method for Reducing Silicide Defects in Integrated Circuits
Patent: 7,745,320 →
Application: 12/124,177 →
Publication: US 2009/0289309
Related Assignments (6)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest May 21, 2008
From: YE, JEFF JIANHUI; LIU, HUANG; SEE, ALEX KH; LU, WEI
To: CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
Reel/Frame 020981/0492 →
Change of Name Jul 14, 2011
From: CHARTERED SEMICONDUCTOR MANUFACTURING PTE. LTD.
To: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Reel/Frame 026587/0815 →
Security Agreement Nov 27, 2018
From: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 047660/0203 →
Release of Security Interest Nov 18, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054475/0718 →
Assignment of Assignor's Interest Nov 19, 2020
From: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Reel/Frame 054600/0031 →
Release of Security Interest Nov 19, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Reel/Frame 054481/0673 →