Patent Assignment
Reel/Frame 027126/0246
Assignment of Assignor's Interest
Recorded: 2011-10-26
Pages: 6
Assignor
FUJITSU LIMITED
Executed: 2009-01-23
Assignee
FUJITSU MICROELECTRONICS LIMITED
7-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU, TOKYO, 163-0722, JAPAN
Covered Property
(1)
Delay Fault Test Quality Calculation Apparatus, Delay Fault Test Quality Calculation Method, and Delay Fault Test Pattern Generation Apparatus
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 26, 2011
From: NOZUYAMA, YASUYUKI; TAKATORI, ATSUO
To: KABUSHIKI KAISHA TOSHIBA; FUJITSU LIMITED
Reel/Frame 027126/0092 →
Change of Name
Oct 26, 2011
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 027129/0001 →
Assignment of Assignor's Interest
Apr 5, 2016
From: KABUSHIKI KAISHA TOSHIBA; FUJITSU SEMICONDUCTOR LIMITED
To: KABUSHIKI KAISHA TOSHIBA; SOCIONEXT INC.
Reel/Frame 038197/0037 →
Change of Address
Apr 5, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 038361/0492 →
Assignment of Assignor's Interest
Jan 30, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 044762/0711 →