Patent Assignment
Reel/Frame 038197/0037
Assignment of Assignor's Interest
Recorded: 2016-04-05
Pages: 5
Assignors
KABUSHIKI KAISHA TOSHIBA
Executed: 2016-03-07
FUJITSU SEMICONDUCTOR LIMITED
Executed: 2016-02-16
Assignees
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
SOCIONEXT INC.
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU, YOKOHAMA-SHI, KANAGAWA, 222-0033, JAPAN
Covered Properties
(2)
Delay Fault Test Quality Calculation Apparatus, Delay Fault Test Quality Calculation Method, and Delay Fault Test Pattern Generation Apparatus
Delay Fault Test Quality Calculation Apparatus, Delay Fault Test Quality Calculation Method, and Delay Fault Test Pattern Generation Apparatus
Related Assignments
(8)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jan 11, 2008
From: NOZUYAMA, YASUYUKI; TAKATORI, ATSUO
To: KABUSHIKI KAISHA TOSHIBA; FUJITSU LIMITED
Reel/Frame 020355/0381 →
Assignment of Assignor's Interest
Feb 13, 2009
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 022248/0521 →
Change of Name
Sep 20, 2011
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 026938/0266 →
Assignment of Assignor's Interest
Oct 26, 2011
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 027126/0246 →
Assignment of Assignor's Interest
Oct 26, 2011
From: NOZUYAMA, YASUYUKI; TAKATORI, ATSUO
To: KABUSHIKI KAISHA TOSHIBA; FUJITSU LIMITED
Reel/Frame 027126/0092 →
Change of Name
Oct 26, 2011
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 027129/0001 →
Change of Address
Apr 5, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 038361/0492 →
Assignment of Assignor's Interest
Jan 30, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 044762/0711 →