Patent Assignment
Reel/Frame 030548/0366
Assignment of Assignor's Interest
Recorded: 2013-06-05
Pages: 3
Assignor
BINKHOFF, PETER
Executed: 2013-05-27
Assignee
ELMOS SEMICONDUCTOR AG
HEINRICH-HERTZ-STRASSE 1, DORTMUND, 44227, GERMANY
Covered Property
(1)
Method for Measuring a Microelectromechanical Semiconductor Component
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
May 20, 2021
From: ELMOS SEMICONDUCTOR SE
To: SILICON MICROSTRUCTURES, INC.
Reel/Frame 056296/0706 →
Change of Name
May 20, 2021
From: ELMOS SEMICONDUCTOR AG
To: ELMOS SEMICONDUCTOR SE
Reel/Frame 056312/0010 →
Merger
Jun 21, 2022
From: SILICON MICROSTRUCTURES, INC.
To: MEASUREMENT SPECIALTIES, INC.
Reel/Frame 060257/0267 →