IP Library Assignment 056296/0706
Patent Assignment
Reel/Frame 056296/0706

Assignment of Assignor's Interest

Recorded: 2021-05-20 Pages: 6
Assignor
ELMOS SEMICONDUCTOR SE
Executed: 2021-05-10
Assignee
SILICON MICROSTRUCTURES, INC.
1701 MCCARTHY BOULEVARD, MILPITAS, CALIFORNIA, 95035
Covered Properties (15)
Sensor Element and Sensor Assembly Provided with a Casing
Patent: 7,685,881 →
Application: 12/056,585 →
Publication: US 2008/0236292
Pressure-Sensitive Amplifier Stage
Patent: 8,698,213 →
Application: 13/367,789 →
Publication: US 2012/0198946
Microelectromechanical Semiconductor Component That Is Sensitive to Mechanical Stresses, and Comprises an Ion Implantation Masking Material Defining a Channel Region
Patent: 8,975,671 →
Application: 13/521,141 →
Publication: US 2013/0087864
Method for the Production of Micro-Electromechanical Semiconductor Component
Patent: 8,841,156 →
Application: 13/521,146 →
Publication: US 2013/0193529
Micro-Electromechanical Semiconductor Comprising Stress Measuring Element and Stiffening Braces Separating Wall Depressions
Patent: 8,994,128 →
Application: 13/521,158 →
Publication: US 2013/0087865
Micro-Electromechanical Semiconductor Component
Patent: 9,013,015 →
Application: 13/521,168 →
Publication: US 2013/0200439
Micro-Electromechanical Semiconductor Component and Method for the Production Thereof
Patent: 9,126,826 →
Application: 13/521,175 →
Publication: US 2013/0087866
Method for Producing a Microelectromechanical Device and Microelectromechanical Device
Patent: 9,034,680 →
Application: 13/583,384 →
Publication: US 2013/0126948
Stress-Sensitive Micro-Electromechanical Device and Use Thereof
Patent: 8,916,944 →
Application: 13/583,392 →
Publication: US 2013/0193535
Microelectromechanical Component and Method for Testing a Microelectromechanical Component
Patent: 9,399,572 →
Application: 13/981,506 →
Publication: US 2013/0305804
Method for Measuring a Microelectromechanical Semiconductor Component
Patent: 9,322,731 →
Application: 13/990,337 →
Publication: US 2013/0263643
Method and Device for Measuring a Microelectromechanical Semiconductor Component
Patent: 8,943,907 →
Application: 13/990,349 →
Publication: US 2013/0247688
Semiconductor Component
Patent: 9,403,676 →
Application: 14/622,075 →
Publication: US 2015/0158717
Micro-Electromechanical Semiconductor Component
Patent: 9,403,677 →
Application: 14/631,064 →
Publication: US 2015/0166327
Method for Producing a Microelectromechanical Device and Microelectromechanical Device
Patent: 9,435,699 →
Application: 14/689,685 →
Publication: US 2015/0219507
Related Assignments (19)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jun 2, 2008
From: REIJS, ALBERTUS THEODORUS JOHANNES
To: ELMOS ADVANCED PACKAGING B.V.
Reel/Frame 021026/0909 →
Corrective Assignment to Correct the Assignee's Postal Code Previously Recorded on Reel 021026 Frame 0909. Assignor(S) Hereby Confirms the Assignment of Assignor's Interest. Jul 22, 2008
From: REIJA, ALBERTUS THEODORUS JOHANNES
To: ELMOS ADVANCED PACKAGING B.V.
Reel/Frame 021274/0319 →
Assignment of Assignor's Interest Jun 20, 2011
From: ELMOS ADVANCED PACKAGING B.V.
To: SENCIO B.V.
Reel/Frame 026480/0333 →
Assignment of Assignor's Interest Feb 13, 2012
From: BUESSER, WOLFGANG
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 027691/0565 →
Settlement Agreement Jun 22, 2012
From: SENCIO B.V.
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 028430/0026 →
Assignment of Assignor's Interest Nov 21, 2012
From: BURCHARD, BERND
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 029337/0362 →
Assignment of Assignor's Interest Nov 21, 2012
From: TEN-HAVE, ARND
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 029337/0492 →
Assignment of Assignor's Interest Dec 7, 2012
From: SENF, REINHARD
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 029424/0872 →
Assignment of Assignor's Interest Dec 20, 2012
From: TEN HAVE, ARND
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 029512/0610 →
Assignment of Assignor's Interest Dec 20, 2012
From: TEN HAVE, ARND
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 029512/0500 →
Assignment of Assignor's Interest Mar 14, 2013
From: DOELLE, MICHAEL
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 030003/0019 →
Assignment of Assignor's Interest Apr 11, 2013
From: BURCHARD, BERND
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 030200/0132 →
Assignment of Assignor's Interest Apr 11, 2013
From: DOELLE, MICHAEL; NINGNING, ZHOU
To: SILICON MICROSTRUCTURES, INC.
Reel/Frame 030200/0274 →
Assignment of Assignor's Interest Jun 5, 2013
From: BINKHOFF, PETER
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 030548/0366 →
Assignment of Assignor's Interest Jun 5, 2013
From: BINKHOFF, PETER
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 030546/0936 →
Assignment of Assignor's Interest Aug 14, 2013
From: BURCHARD, BERND; DOELLE, MICHAEL
To: ELMOS SEMICONDUCTOR AG; SILICON MICROSTRUCTURES, INC.
Reel/Frame 031004/0786 →
Change of Name May 20, 2021
From: ELMOS SEMICONDUCTOR AG
To: ELMOS SEMICONDUCTOR SE
Reel/Frame 056312/0010 →
Merger Jun 17, 2022
From: SILICON MICROSTRUCTURES, INC.
To: MEASUREMENT SPECIALTIES, INC.
Reel/Frame 060237/0556 →
Merger Jun 21, 2022
From: SILICON MICROSTRUCTURES, INC.
To: MEASUREMENT SPECIALTIES, INC.
Reel/Frame 060257/0267 →