IP Library Assignment 031214/0820
Patent Assignment
Reel/Frame 031214/0820

Assignment of Assignor's Interest

Recorded: 2013-09-16 Pages: 2
Assignor
SIM, WOO YOUNG
Executed: 2013-09-12
Assignee
LG SILTRON INC.
274, IMSU-DONG, GUMI-SI, GYEONGBUK, 730-350, KOREA, REPUBLIC OF
Covered Property (1)
Silicon Single Crystal Wafer, Manufacturing Method Thereof and Method of Detecting Defects
Patent: 9,406,528 →
Application: 14/028,063 →
Publication: US 2014/0191370
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jan 5, 2018
From: LG SILTRON INCORPORATED
To: SK SILTRON CO., LTD.
Reel/Frame 045012/0661 →
Change of Name Jan 18, 2018
From: LG SILTRON INCORPORATED
To: SK SILTRON CO., LTD.
Reel/Frame 045084/0492 →