IP Library › Assignment 045012/0661
Patent Assignment
Reel/Frame 045012/0661

Change of Name

Recorded: 2018-01-05 Pages: 5
Assignor
LG SILTRON INCORPORATED
Executed: 2017-08-22
Assignee
SK SILTRON CO., LTD.
53 IMSU-RO, GUMI-SI, GYEONGSANGBUK-DO, 39386, KOREA, REPUBLIC OF
Covered Properties (2)
Silicon Single Crystal Wafer, Manufacturing Method Thereof and Method of Detecting Defects
Patent: 9,406,528 →
Application: 14/028,063 →
Publication: US 2014/0191370
Silicon Single Crystal Wafer, Manufacturing Method Thereof and Method of Detecting Defects
Patent: 9,917,022 →
Application: 15/198,770 →
Publication: US 2016/0315020
Related Assignments (2)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 16, 2013
From: SIM, WOO YOUNG
To: LG SILTRON INC.
Reel/Frame 031214/0820 →
Change of Name Jan 18, 2018
From: LG SILTRON INCORPORATED
To: SK SILTRON CO., LTD.
Reel/Frame 045084/0492 →