Patent Assignment
Reel/Frame 045084/0492
Change of Name
Recorded: 2018-01-18
Pages: 5
Assignor
LG SILTRON INCORPORATED
Executed: 2017-08-22
Assignee
SK SILTRON CO., LTD.
53 IMSU-RO, GUMI-SI, GYEONGSANGBUK-DO, 39386, KOREA, REPUBLIC OF
Covered Property
(1)
Silicon Single Crystal Wafer, Manufacturing Method Thereof and Method of Detecting Defects
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.