Patent Assignment
Reel/Frame 037130/0383
Assignment of Assignor's Interest
Recorded: 2015-11-24
Pages: 3
Assignor
KONONCHUK, OLEG
Executed: 2015-07-16
Assignee
SOITEC
CHEMIN DES FRANQUES, PARC TECHNOLOGIQUE DES FONTAINES, BERNIN, 38190, FRANCE
Covered Property
(1)
Method for Measuring Thickness Variations in a Layer of a Multilayer Semiconductor Structure
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.