Patent Assignment
Reel/Frame 037130/0402
Assignment of Assignor's Interest
Recorded: 2015-11-24
Pages: 3
Assignor
DUTARTRE, DIDIER
Executed: 2015-11-17
Assignee
STMICROELECTRONICS (CROLLES 2) SAS
850, RUE JEAN MONNET, CROLLES, F-38920, FRANCE
Covered Property
(1)
Method for Measuring Thickness Variations in a Layer of a Multilayer Semiconductor Structure
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.