Patent Assignment
Reel/Frame 037874/0117
Assignment of Assignor's Interest
Recorded: 2016-03-02
Pages: 3
Assignors
KOBAYASHI, KENTARO
Executed: 2016-02-26
HAMASAKI, HIROSHI
Executed: 2016-02-26
NAKAMURA, NAOFUMI
Executed: 2016-02-26
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property
(1)
Semiconductor Analysis Chip and Particle Inspection Method
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 16, 2020
From: KABUSHIKI KAISHA TOSHIBA
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 053782/0760 →
Assignment of Assignor's Interest
Sep 16, 2020
From: KABUSHIKI KAISHA TOSHIBA; TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
To: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 053782/0830 →
Assignment of Assignor's Interest
Nov 27, 2020
From: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
To: AIPORE, INC.
Reel/Frame 054477/0524 →