IP Library › Assignment 053782/0830
Patent Assignment
Reel/Frame 053782/0830

Assignment of Assignor's Interest

Recorded: 2020-09-16 Pages: 3
Assignors
KABUSHIKI KAISHA TOSHIBA
Executed: 2020-08-06
Assignee
TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
1-1, SHIBAURA 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Properties (3)
Semiconductor Analysis Chip and Particle Inspection Method
Application: 15/058,896 →
Publication: US 2017/0074824
Measurement Device
Patent: 9,995,729 →
Application: 14/938,164 →
Publication: US 2016/0187294
Method and Device for Detecting Sample
Patent: 9,804,116 →
Application: 14/959,133 →
Publication: US 2016/0187335
Related Assignments (6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 11, 2015
From: NAKAMURA, YOSHIAKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037013/0369 →
Assignment of Assignor's Interest Dec 4, 2015
From: HONGO, SADATO; MIYAMOTO, HIROHISA
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037209/0801 →
Assignment of Assignor's Interest Mar 2, 2016
From: KOBAYASHI, KENTARO; HAMASAKI, HIROSHI; NAKAMURA, NAOFUMI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037874/0117 →
Assignment of Assignor's Interest Sep 16, 2020
From: KABUSHIKI KAISHA TOSHIBA
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 053782/0760 →
Assignment of Assignor's Interest Nov 27, 2020
From: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
To: AIPORE, INC.
Reel/Frame 054477/0524 →
Assignment of Assignor's Interest Nov 27, 2020
From: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
To: AIPORE INC.
Reel/Frame 054477/0831 →