Patent Assignment
Reel/Frame 053782/0760
Assignment of Assignor's Interest
Recorded: 2020-09-16
Pages: 4
Assignor
KABUSHIKI KAISHA TOSHIBA
Executed: 2020-08-06
Assignees
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU,, TOKYO, 105-8001, JAPAN
TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
1-1, SHIBAURA 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Properties
(3)
Semiconductor Analysis Chip and Particle Inspection Method
Measurement Device
Method and Device for Detecting Sample
Related Assignments
(6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Nov 11, 2015
From: NAKAMURA, YOSHIAKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037013/0369 →
Assignment of Assignor's Interest
Dec 4, 2015
From: HONGO, SADATO; MIYAMOTO, HIROHISA
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037209/0801 →
Assignment of Assignor's Interest
Mar 2, 2016
From: KOBAYASHI, KENTARO; HAMASAKI, HIROSHI; NAKAMURA, NAOFUMI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037874/0117 →
Assignment of Assignor's Interest
Sep 16, 2020
From: KABUSHIKI KAISHA TOSHIBA; TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
To: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 053782/0830 →
Assignment of Assignor's Interest
Nov 27, 2020
From: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
To: AIPORE, INC.
Reel/Frame 054477/0524 →
Assignment of Assignor's Interest
Nov 27, 2020
From: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
To: AIPORE INC.
Reel/Frame 054477/0831 →