Patent Assignment
Reel/Frame 041031/0881
Change of Name
Recorded: 2016-12-19
Pages: 3
Assignor
SEMICONDUCTOR INSIGHTS INC.
Executed: 2014-08-21
Assignee
TECHINSIGHTS INC.
3000 SOLANDT ROAD, OTTAWA, ONTARIO, K2K 2X2, CANADA
Covered Properties
(2)
Method and System for Ion Beam Delayering of a Sample and Control Thereof
Method and System for Ion Beam Delayering of a Sample and Control Thereof
Related Assignments
(4)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 15, 2016
From: FOSTER, ROBERT K; PAWLOWICZ, CHRISTOPHER; ABT, JASON; JONES, IAN
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 040638/0039 →
Notice of Grant of Security Interest in Patents
Aug 16, 2017
From: TECHINSIGHTS INC.
To: STELLUS CAPITAL INVESTMENT CORPORATION, AS ADMINISTRATIVE AGENT
Reel/Frame 043571/0385 →
Security Interest
Nov 10, 2021
From: TECHINSIGHTS INC.; VLSI RESEARCH INC.
To: CAPITAL ONE, NATIONAL ASSOCIATION
Reel/Frame 058096/0721 →
Release of Security Interest
Nov 12, 2021
From: STELLUS CAPITAL INVESTMENT CORPORATION, AS ADMINISTRATIVE AGENT
To: TECHINSIGHTS INC.
Reel/Frame 058096/0558 →