Patent Assignment
Reel/Frame 043571/0385
Notice of Grant of Security Interest in Patents
Recorded: 2017-08-16
Pages: 8
Assignor
TECHINSIGHTS INC.
Executed: 2017-08-16
Assignee
STELLUS CAPITAL INVESTMENT CORPORATION, AS ADMINISTRATIVE AGENT
4400 POST OAK PARKWAY, SUITE 2200, HOUSTON, TEXAS, 77027
Covered Properties
(40)
Computer-Assisted Design Analysis Method for Extracting Device and Interconnect Information
Patent:
6,289,116 →
Application:
08/939,047 →
Method to Extract Circuit Information
Patent:
6,236,746 →
Application:
08/942,113 →
Automatic Focused Ion Beam Imaging System and Method
Patent:
6,453,063 →
Application:
09/238,435 →
Automated Method of Circuit Analysis
Patent:
6,288,393 →
Application:
09/238,436 →
Method and System for Recalibration During Micro-Imaging to Determine Thermal Drift
Patent:
6,768,102 →
Application:
09/594,169 →
Lock-Step Cursors for Feature Alignment
Patent:
6,549,222 →
Application:
09/604,252 →
Method and Apparatus for Focusing a Micro-Imaging System Onto a Tilted or Uneven Sample to Acquire Images of the Sample
Patent:
6,763,140 →
Application:
09/657,164 →
Schematic Organization Tool
Advanced Schematic Editor
Design Analysis Workstation for Analyzing Integrated Circuits
Computer Aided Method of Circuit Extraction
Design Analysis Workstation for Analyzing Integrated Circuits
Method and Apparatus for Locating Short Circuit Faults in an Integrated Circuit Layout
Method and Apparatus for Removing Uneven Brightness in an Image
Method and Apparatus for Reducing Redundant Data in a Layout Data Structure
Method of Design Analysis of Existing Integrated Circuits
Method and Apparatus for Removing Dummy Features from a Data Structure
Method of Registering and Aligning Multiple Images
Method of Preparing an Integrated Circuit Die for Imaging
Design Analysis Workstation for Analyzing Integrated Circuits
Method of Bibliographic Field Normalization
Method and Apparatus for Removing Dummy Features from a Data Structure
Method of Local Tracing of Connectivity and Schematic Representations Produced Therefrom
Method of Labelling Swappable Pins for Integrated Circuit Pattern Matching
Integrated Circuit Characterisation System and Method
Method of Design Analysis of Existing Integrated Circuits
Method of Design Analysis of Existing Integrated Circuits
Method and Apparatus for Removing Dummy Features from a Data Structure
Integrated Circuit Analysis Systems and Methods
Circuit Visualization Using Flightlines
Method of Deriving an Integrated Circuit Schematic Diagram
Digital Netlist Partitioning System For Faster Circuit Reverse-Engineering
Method of Bibliographic Field Normalization
Method and System for Ion Beam Delayering of a Sample and Control Thereof
Circuit Tracing Using a Focused Ion Beam
Patent:
8,791,436 →
Application:
13/869,749 →
Circuit Tracing Using a Focused Ion Beam
Circuit Tracing Using a Focused Ion Beam
Circuit Tracing Using a Focused Ion Beam
Method and System for Ion Beam Delayering of a Sample and Control Thereof
Method and System for Ion Beam Delayering of a Sample and Control Thereof
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 11, 1997
From: CHAMBERLAIN, GEORGE; IOUDOVSKI, ALEXEI; THOMAS, JOHN SCOTT; NAIM, GHASSAM
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 008847/0460 →
Assignment of Assignor's Interest
Apr 16, 1998
From: CHAMBERLAIN, GEORGE; LAM, LARRY
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 009136/0370 →
Assignment of Assignor's Interest
Apr 15, 1999
From: PHANEUF, MICHAEL; JAMES, DICK; ELVIDGE, JULIA; BRETON, PIERRETTE
To: CHIPWORKS
Reel/Frame 009890/0925 →
Assignment of Assignor's Interest
Apr 15, 1999
From: PHANEUF, MICHAEL; JAMES, DICK; BRETON, PIERRETTE; ELVIDGE, JULIA
To: CHIPWORKS
Reel/Frame 009890/0920 →
Assignment of Assignor's Interest
Jun 15, 2000
From: SKOLL, DAVID F.
To: CHIPWORKS
Reel/Frame 010876/0389 →
Affidavit
Jun 27, 2000
From: SKOLL, DAVID F.
To: CHIPWORKS
Reel/Frame 010897/0287 →
Affidavit
Jan 31, 2001
From: SKOLL, DAVID F.
To: CHIPWORKS
Reel/Frame 011484/0899 →
Change of Name
Jun 14, 2001
From: SEMICONDUCTOR INSIGHTS INC.
To: ORISAR INC.
Reel/Frame 011895/0286 →
Assignment of Assignor's Interest
Jun 14, 2001
From: ORISAR, INC.
To: SEMICONDUCTOR INSIGHTS, INC.
Reel/Frame 011887/0965 →
Assignment of Assignor's Interest
Aug 3, 2001
From: GONT, VAL; ABT, JASON; LAM, LARRY; IOUDOVSKI, ALEXEI
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 012048/0162 →
Assignment of Assignor's Interest
Aug 3, 2001
From: GONT, VAL; ABT, JASON; LAM, LARRY
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 012056/0846 →
Assignment of Assignor's Interest
Aug 13, 2001
From: LUDLOW, TERRY; ELVIDGE, JULIA; PHANEUF, MICHAEL
To: CHIPWORKS
Reel/Frame 012076/0305 →
Assignment of Assignor's Interest
Oct 10, 2002
From: ABT, JASON; KAPLER, THOMAS; BEGG, STEPHEN
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 013373/0406 →
Assignment of Assignor's Interest
Aug 4, 2004
From: ZAVADSKY, VYACHESLAV L.; AITNOURI, ELMEHDI; KEYES, EDWARD; ABT, JASON
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 015654/0588 →
Assignment of Assignor's Interest
Aug 12, 2004
From: ZAVADSKY, VYACHESLAV; ABT, JASON
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 015682/0448 →
Assignment of Assignor's Interest
Feb 1, 2005
From: ZAVADSKY, VYACHESLAV L.; GONT, VAL; KEYES, EDWARD; ABT, JASON
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 016224/0676 →
Assignment of Assignor's Interest
Apr 7, 2005
From: KEYES, EDWARD; AITNOURI, ELMEHDI; BEGG, STEPHEN; GONT, VAL
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 015871/0083 →
Assignment of Assignor's Interest
Aug 10, 2005
From: ZAVADSKY, VYACHESLAV; ABT, JASON; BRAVERMAN, MARK; KEYES, EDWARD
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 016872/0368 →
Assignment of Assignor's Interest
Sep 26, 2005
From: OUALI, MOHAMMED; ABT, JASON; KEYES, EDWARD; ZAVADSKY, VYACHESLAV
To: SEMICONDUCTOR INSIGHTS INC.
Reel/Frame 016584/0885 →
Assignment of Assignor's Interest
Sep 29, 2005
From: KLIBANOV, LEV; GRIFFIN, SHERRI LYNN
To: CHIPWORKS INC.
Reel/Frame 017060/0026 →
Assignment of Assignor's Interest
Oct 20, 2008
From: OUALI, MOHAMMED; ABT, JASON; KEYES, EDWARD; ZAVADSKY, VYACHESLAV
To: SEMICONDUCTOR INSIGHT INC.
Reel/Frame 021728/0347 →
Change of Name
Oct 9, 2014
From: SEMICONDUCTOR INSIGHTS INC.
To: TECHINSIGHTS INC.
Reel/Frame 033941/0692 →
Assignment of Assignor's Interest
Jun 20, 2018
From: CHIPWORKS INC.
To: TECHINSIGHTS INC.
Reel/Frame 046143/0682 →
Assignment of Assignor's Interest
Jun 20, 2018
From: CHIPWORKS
To: TECHINSIGHTS INC.
Reel/Frame 046143/0627 →
Security Interest
Nov 10, 2021
From: TECHINSIGHTS INC.; VLSI RESEARCH INC.
To: CAPITAL ONE, NATIONAL ASSOCIATION
Reel/Frame 058096/0721 →