Patent Assignment
Reel/Frame 041610/0882
Change of Address
Recorded: 2017-02-03
Pages: 13
Assignor
HITACHI, LTD.
Executed: 2004-09-27
Assignee
HITACHI, LTD.
6-6, MARUNOUCHI 1-CHOME, CHIYODA-KU,, TOKYO,, JAPAN
Covered Property
(1)
Method and Its Apparatus for Inspecting Particles or Defects of a Semiconductor Device
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Aug 18, 2004
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015065/0870 →
Assignment of Assignor's Interest
Jul 21, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016547/0118 →
Assignment of Assignor's Interest
Feb 3, 2017
From: HITACHI, LTD.
To: HITACHI HI-TECHNOLOGIES CORPORATION
Reel/Frame 041164/0139 →
Corrective Assignment to Correct the Address Previously Recorded on Reel 041164 Frame 0139. Assignor(S) Hereby Confirms the Address Should Be High-Technologies and Not Hi-Technologies.
Feb 9, 2017
From: HITACHI, LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 041666/0181 →
Change of Name and Address
Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →