Patent Assignment
Reel/Frame 015065/0870
Change of Name
Recorded: 2004-08-18
Pages: 6
Assignor
HITACHI ELECTRONICS ENGINEERING CO., LTD.
Executed: 2004-04-01
Assignee
HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO, JAPAN
Covered Properties
(3)
System Quality Control Where Inspection Frequency of Inspection Apparatus Is Reset to Minimize Expected Total Loss Based on Derived Frequency Function and Loss Value
Patent:
6,002,989 →
Application:
08/831,298 →
Method for Analyzing Defect Data and Inspection Apparatus and Review System
Method and Its Apparatus for Inspecting Particles or Defects of a Semiconductor Device
Related Assignments
(5)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jul 21, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016547/0118 →
Assignment of Assignor's Interest
Feb 3, 2017
From: HITACHI, LTD.
To: HITACHI HI-TECHNOLOGIES CORPORATION
Reel/Frame 041164/0139 →
Change of Address
Feb 3, 2017
From: HITACHI, LTD.
To: HITACHI, LTD.
Reel/Frame 041610/0882 →
Corrective Assignment to Correct the Address Previously Recorded on Reel 041164 Frame 0139. Assignor(S) Hereby Confirms the Address Should Be High-Technologies and Not Hi-Technologies.
Feb 9, 2017
From: HITACHI, LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 041666/0181 →
Change of Name and Address
Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →