Patent Assignment
Reel/Frame 044380/0417
Assignment of Assignor's Interest
Recorded: 2017-12-13
Pages: 3
Assignor
KABUSHIKI KAISHA TOSHIBA
Executed: 2017-12-05
Assignee
TOSHIBA MEMORY CORPORATION
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-0023, JAPAN
Covered Properties
(3)
Pattern Inspection Apparatus
Pattern Inspection Method
Pattern Test Apparatus
Related Assignments
(8)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 20, 2012
From: KABUSHIKI KAISHA TOPCON
To: NUFLARE TECHNOLOGY, INC.
Reel/Frame 028996/0496 →
Assignment of Assignor's Interest
Aug 1, 2013
From: OGAWA, RIKI; HIRONO, MASATOSHI
To: NUFLARE TECHNOLOGY, INC.; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 030925/0209 →
Assignment of Assignor's Interest
May 30, 2018
From: NUFLARE TECHNOLOGY, INC.
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 045936/0530 →
Corporate Address Change
May 30, 2018
From: NUFLARE TECHNOLOGY, INC.
To: NUFLARE TECHNOLOGY, INC.
Reel/Frame 046269/0344 →
Merger and Change of Name
Sep 7, 2021
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 057426/0778 →
Change of Name
Sep 7, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 057426/0836 →
Change of Name
Jan 20, 2022
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 058785/0197 →
Merger and Change of Name
Jan 20, 2022
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 058785/0124 →