IP Library Assignment 051879/0775
Patent Assignment
Reel/Frame 051879/0775

Assignment of Assignor's Interest

Recorded: 2020-02-20 Pages: 3
Assignors
ITO, NAOTO
Executed: 2020-01-06
YAMAZAWA, YU
Executed: 2020-01-07
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Device, and Observation Method and Elemental Analysis Method Using the Same
Application: 16/640,613 →
Publication: US 2020/0185190
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Feb 19, 2021
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 055345/0818 →