Patent Assignment
Reel/Frame 055345/0818
Change of Name
Recorded: 2021-02-19
Pages: 10
Assignor
HITACHI HIGH-TECHNOLOGIES CORPORATION
Executed: 2020-02-12
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Charged Particle Beam Device, and Observation Method and Elemental Analysis Method Using the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.