Patent Assignment
Reel/Frame 053837/0424
Split and Succession
Recorded: 2020-09-01
Pages: 11
Assignor
KABUSHIKI KAISHA TOSHIBA
Executed: 2017-07-01
Assignee
TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
1-1, SHIBAURA 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Properties
(6)
Sample Detection Apparatus and Detection Method
Semiconductor Analysis Microchip and Method of Manufacturing the Same
Semiconductor Micro-Analysis Chip and Method of Manufacturing the Same
Analysis Package for Detecting Particles in a Sample Liquid
Analysis Package for Detecting Particles in a Sample Liquid Including an Analysis Chip Mounted on a Package Board
Semiconductor Micro-Analysis Chip and Method of Manufacturing the Same
Related Assignments
(7)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 27, 2013
From: HONGO, SADATO; KOBAYASHI, KENTARO; FURUYAMA, HIDETO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 031095/0015 →
Assignment of Assignor's Interest
Aug 28, 2013
From: KOBAYASHI, KENTARO; FURUYAMA, HIDETO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 031102/0953 →
Assignment of Assignor's Interest
Mar 5, 2014
From: MIKI, HIROKO; FURUYAMA, HIDETO; KOBAYASHI, KENTARO; KOJIMA, AKIHIRO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 032359/0544 →
Assignment of Assignor's Interest
Oct 6, 2015
From: HAMASAKI, HIROSHI; NISHIGAKI, MICHIHIKO; ONOZUKA, YUTAKA; KOBAYASHI, KENTARO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 036738/0901 →
Assignment of Assignor's Interest
Oct 6, 2015
From: HAMASAKI, HIROSHI; NISHIGAKI, MICHIHIKO; ONOZUKA, YUTAKA; KOBAYASHI, KENTARO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 036738/0356 →
Assignment of Assignor's Interest
Jan 18, 2017
From: KOBAYASHI, KENTARO; NISHIGAKI, MICHIHIKO; HAMASAKI, HIROSHI; NAKAMURA, NAOFUMI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 041005/0381 →
Assignment of Assignor's Interest
Nov 27, 2020
From: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
To: AIPORE, INC.
Reel/Frame 054477/0524 →