IP Library › Assignment 058125/0370
Patent Assignment
Reel/Frame 058125/0370

Assignment of Assignor's Interest

Recorded: 2021-11-16 Pages: 11
Assignor
SVXR, INC.
Executed: 2021-09-09
Assignee
BRUKER NANO, INC.
112 ROBIN HILL ROAD, SANTA BARBARA, CALIFORNIA, 93117
Covered Properties (28)
Method and Apparatus for Rapidly Classifying Defects in Subcomponents of Manufactured Component
Method and Apparatus for Rapid Inspection of Subcomponents of Manufactured Component
Methods and Systems for Detecting Defects in Devices Using X-Rays
Methods and Systems for Defects Detection and Classification Using X-Rays
Methods and Systems for Process Control Based on X-Ray Inspection
Methods and Systems for Product Failure Prediction Based on X-Ray Image Re-Examination
Methods and Systems for Manufacturing Printed Circuit Board Based on X-Ray Inspection
Methods and Systems for Printed Circuit Board Design Based on Automatic Corrections
Methods and Systems for Inspecting Integrated Circuits Based on X-Rays
High speed x-ray inspection microscope
Patent: 9,129,715 →
Application: 13/987,808 →
Publication: US 2014/0064445
Devices Processed Using X-Rays
Patent: 9,607,724 →
Application: 14/732,674 →
Publication: US 2015/0270023
High Speed X-Ray Microscope
Patent: 9,646,732 →
Application: 15/231,774 →
Publication: US 2016/0351283
Devices Processed Using X-Rays
Application: 15/470,726 →
Publication: US 2017/0200524
Super-Resolution X-Ray Imaging Method and Apparatus
Application: 16/053,627 →
Publication: US 2020/0013145
Devices Processed Using X-Rays
Application: 16/786,912 →
Method and Apparatus for Rapidly Classifying Defects in Subcomponents of Manufactured Component
Application: 16/830,108 →
Publication: US 2020/0380654
Method and Apparatus for Rapid Inspection of Subcomponents of Manufactured Component
Application: 16/874,248 →
Publication: US 2020/0380664
Super-Resolution X-Ray Imaging Method and Apparatus
Application: 16/879,073 →
Publication: US 2020/0279351
Methods and Systems for Detecting Defects in Devices Using X-rays
Application: 16/924,581 →
Publication: US 2021/0012499
Methods and Systems for Defects Detection and Classification Using X-rays
Application: 16/924,645 →
Publication: US 2021/0010953
Methods and Systems for Process Control Based on X-ray Inspection
Application: 16/924,663 →
Publication: US 2021/0011177
Methods and Systems for Product Failure Prediction based on X-ray Image Re-examination
Application: 16/924,706 →
Publication: US 2021/0010954
Methods and Systems for Manufacturing Printed Circuit Board based on X-ray Inspection
Application: 16/924,747 →
Publication: US 2021/0014979
Methods and Systems for Printed Circuit Board Design Based on Automatic Corrections
Application: 16/924,769 →
Publication: US 2021/0012054
Methods and Systems for Printed Circuit Board Design Based on Automatic Corrections
Application: 17/325,591 →
Publication: US 2021/0279878
Super-Resolution X-Ray Imaging Method and Apparatus
Application: 17/339,136 →
Publication: US 2021/0295469
Methods and Systems for Inspecting Integrated Circuits Based on X-Rays
Application: 17/394,357 →
Publication: US 2022/0042795
Methods and Systems for Inspecting Integrated Circuits Based on X-rays
Application: 63/062,299 →
Related Assignments (16)
Other recorded transfers of the patents in this record — the chain of ownership.
Nunc Pro Tunc Assignment Jun 5, 2015
From: ADLER, DAVID LEWIS; ADLER, BENJAMIN THOMAS; BABIAN, FREDDIE ERICH
To: SVXR, INC
Reel/Frame 035835/0688 →
Nunc Pro Tunc Assignment Mar 28, 2017
From: ADLER, DAVID LEWIS; ADLER, BENJAMIN THOMAS; BABIAN, FREDDIE ERICH
To: SVXR, INC
Reel/Frame 041770/0116 →
Assignment of Assignor's Interest Aug 29, 2018
From: RATNER, EDWARD R.; ADLER, DAVID L.
To: SVXR, INC.
Reel/Frame 046736/0555 →
Assignment of Assignor's Interest Sep 30, 2019
From: ADLER, DAVID LEWIS
To: SVXR, INC.
Reel/Frame 050569/0380 →
Assignment of Assignor's Interest Apr 7, 2020
From: RATNER, EDWARD R.; REID, ANDREW GEORGE
To: SVXR, INC.
Reel/Frame 052328/0282 →
Assignment of Assignor's Interest May 21, 2020
From: RATNER, EDWARD R.; HU, RENJIE
To: SVXR, INC.
Reel/Frame 052728/0338 →
Assignment of Assignor's Interest Jul 28, 2020
From: ADLER, DAVID LEWIS; BABIAN, FREDDIE ERICH
To: SVXR, INC.
Reel/Frame 053333/0095 →
Assignment of Assignor's Interest Jul 28, 2020
From: ADLER, DAVID LEWIS; JEWLER, SCOTT JOSEPH
To: SVXR, INC.
Reel/Frame 053333/0545 →
Assignment of Assignor's Interest Jul 28, 2020
From: ADLER, DAVID LEWIS; JEWLER, SCOTT JOSEPH; CHRISSAN, DOUGLAS A.
To: SVXR, INC.
Reel/Frame 053333/0789 →
Assignment of Assignor's Interest Jul 28, 2020
From: ADLER, DAVID LEWIS; JEWLER, SCOTT JOSEPH; BABIAN, FREDDIE ERICH
To: SVXR, INC.
Reel/Frame 053332/0121 →
Assignment of Assignor's Interest Jul 29, 2020
From: ADLER, DAVID LEWIS; JEWLER, SCOTT JOSEPH; BABIAN, FREDDIE ERICH; REID, ANDREW GEORGE
To: SVXR, INC.
Reel/Frame 053340/0345 →
Security Interest Nov 24, 2020
From: SVXR, INC.
To: THE LEVY FAMILY TRUST; GRAND PROCESS TECHNOLOGY GROUP; ASE TEST LIMITED; ADLER, DAVID
Reel/Frame 054453/0507 →
Security Interest Dec 16, 2020
From: SVRX, INC.
To: THE LEVY FAMILY TRUST; GRAND PROCESS TECHNOLOGY GROUP; ASE TEST LIMITED; ADLER, DAVID
Reel/Frame 054667/0315 →
Corrective Assignment to Correct the Application Number 16785912 to Application NUMBER16786912 Previously Recorded on Reel 054453 Frame 0507. Assignor(S) Hereby Confirms the Security Interest. Sep 23, 2021
From: SVXR, INC.
To: THE LEVY FAMILY TRUST; GRAND PROCESS TECHNOLOGY GROUP; ASE TEST LIMITED; ADLER, DAVID
Reel/Frame 057597/0228 →
Corrective Assignment to Correct the Typographical Error in Property Number from Application Number: 16785912 to Application Number:16786912 Previously Recorded on Reel 054667 Frame 0315. Assignor(S) Hereby Confirms the Security Interest. Sep 23, 2021
From: SVRX, INC.
To: THE LEVY FAMILY TRUST; GRAND PROCESS TECHNOLOGY GROUP; ASE TEST LIMITED; ADLER, DAVID
Reel/Frame 057681/0672 →
Release of Security Interest Jan 26, 2022
From: SVXR, INC.
To: THE LEVY FAMILY TRUST; GRAND PROCESS TECHNOLOGY GROUP; ASE TEST LIMITED; ADLER, DAVID
Reel/Frame 058773/0725 →