Corrective Assignment to Correct the the Names of the Conveying Party by Adding Ajay Pai, Tuan D Le. Previously Recorded at Reel: 053117 Frame: 0623. Assignor(S) Hereby Confirms the Assignment.

Recorded: 2022-01-06 Pages: 92

Assignors

PAI, AJAY

Executed: 2006-10-11

LE, TUAN D

Executed: 2006-08-11

RUDOLPH TECHNOLOGIES, INC.

Executed: 2020-04-30

Assignee

ONTO INNOVATION INC.

16 JONSPIN ROAD, WILMINGTON, MASSACHUSETTS, 01887

Covered Properties (3)

Wafer Edge Inspection and Metrology

Patent: 7,865,010 →

Application: 12/571,801 →

Publication: US 2010/0086197

Wafer Edge Inspection and Metrology

Patent: 8,175,372 →

Application: 12/971,722 →

Publication: US 2011/0085725

Wafer Edge Inspection and Metrology

Patent: 8,818,074 →

Application: 13/466,506 →

Publication: US 2013/0022260

Related Assignments (1)

Other recorded transfers of the patents in this record — the chain of ownership.