Patent Assignment
Reel/Frame 059194/0532
Assignment of Assignor's Interest
Recorded: 2022-03-08
Pages: 6
Assignors
LEWIS, BRETT
Executed: 2021-02-04
XIA, DEYING
Executed: 2021-02-04
MCVEY, SHAWN
Executed: 2021-02-03
Assignee
CARL ZEISS MICROSCOPY, LLC
ONE ZEISS DRIVE, THORNWOOD, NEW YORK, 10594
Covered Property
(1)
Inspection System and Inspection Method to Qualify Semiconductor Structures
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.