Patent Assignment
Reel/Frame 062164/0244
Assignment of Assignor's Interest
Recorded: 2022-12-20
Pages: 8
Assignors
RUNDO, FRANCESCO
Executed: 2022-12-14
COFFA, SALVATORE
Executed: 2022-12-14
SARPIETRO, RICCARDO EMANUELE
Executed: 2022-12-15
GIUFFRE', PAOLA CARMELINA
Executed: 2022-12-14
RANDAZZO, GIUSEPPE
Executed: 2022-12-14
SCROPPO, MARCO STEFANO
Executed: 2022-12-14
VINCIGUERRA, DANIELE RICCARDO
Executed: 2022-12-14
Assignee
STMICROELECTRONICS S.R.L.
VIA C. OLIVETTI, 2, AGRATE BRIANZA (MB), 20864, ITALY
Covered Property
(1)
Machine Learning Techniques for Wafer Defect Map Classification
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 20, 2022
From: SPAMPINATO, CONCETTO
To: UNIVERSITA' DEGLI STUDI DI CATANIA - DIPARTIMENTO DI INGEGNERIA ELETTRICA ELETTRONICA E INFORMATICA (DIEEI)
Reel/Frame 062164/0438 →
Assignment of Assignor's Interest
May 16, 2023
From: UNIVERSITA' DEGLI STUDI DI CATANIA
To: STMICROELECTRONICS S.R.L.
Reel/Frame 063652/0812 →
Assignment of Assignor's Interest
Oct 17, 2024
From: STMICROELECTRONICS S.R.L.
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 069180/0793 →